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Electromechanical response of solids underpins image formation mechanism ofseveral scanning probe microscopy techniques including the piezoresponse forcemicroscopy (PFM) and electrochemical strain microscopy (ESM). While the theoryof linear piezoelectric and ionic responses are well developed, thecontributions of quadratic effects including electrostriction and capacitivetip-surface forces to measured signal remain poorly understood. Here we analyzethe electrostrictive and capacitive contributions to the PFM and ESM signalsand discuss the implications of the dielectric tip-surface gap on theseinteractions.

Electrostrictive and electrostatic responses in contact mode voltage modulated Scanning Probe Microscopies