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We present the first findings of the new electrically-detected electron spinresonance technique (EDESR), which reveal the point defects in the ultra-narrowsilicon quantum wells (Si-QW) confined by the superconductor delta-barriers.This technique allows the ESR identification without application of an externalcavity, as well as a high frequency source and recorder, and with measuring theonly response of the magnetoresistance, with internal GHz Josephson emissionwithin frameworks of the normal-mode coupling (NMC) caused by the microcavitiesembedded in the Si-QW plane.

Electrically-Detected ESR in Silicon Nanostructures Inserted in Microcavities