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The Scanning Tunneling Microscope is a powerful tool for studying theelectronic properties at the atomic level, however it's relatively smallscanning range and the fact that it can only operate on conducting samplesprevents its application to study heterogeneous samples consisting onconducting and insulating regions. Here we present a long-range scanningtunneling microscope capable of detecting conducting micro and nanostructureson insulating substrates using a technique based on the capacitance between thetip and the sample and performing STM studies.

Long-range Scanning Tunneling Microscope for the study of nanostructures on insulating substrates