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We report on the direct measurement of the electron-phonon relaxation time,{\tau}eph, in disordered TiN films. Measured values of {\tau}eph are from 5.5ns to 88 ns in the 4.2 to 1.7 K temperature range and consistent with a T-3temperature dependence. The electronic density of states at the Fermi level N0is estimated from measured material parameters. The presented results confirmthat thin TiN films are promising candidate-materials for ultrasensitivesuperconducting detectors.

The electron-phonon relaxation time in thin superconducting titanium nitride films