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We have developed an atom trap trace analysis (ATTA) system to measure Kr inXe at the part per trillion (ppt) level, a prerequisite for the sensitivityachievable with liquid xenon dark matter detectors beyond the currentgeneration. Since Ar and Kr have similar laser cooling wavelengths, theapparatus has been tested with Ar to avoid contamination prior to measuring Xesamples. A radio-frequency (RF) plasma discharge generates a beam of metastableatoms which is optically collimated, slowed, and trapped using standardmagneto-optical techniques. Based on the measured overall system efficiency of$1.2 \times 10^{-8}$ (detection mode) we expect the ATTA system to reach thedesign goal sensitivity to ppt concentrations of Kr in Xe in $<2$ hours.

An atom trap trace analysis system for measuring krypton contamination in xenon dark matter detectors