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We demonstrate enhanced relaxation and dephasing times of transmon qubits, upto ~ 60 \mu s by fabricating the interdigitated shunting capacitors usingtitanium nitride (TiN). Compared to lift-off aluminum deposited simultaneouslywith the Josephson junction, this represents as much as a six-fold improvementand provides evidence that previous planar transmon coherence times are limitedby surface losses from two-level system (TLS) defects residing at or nearinterfaces. Concurrently, we observe an anomalous temperature dependentfrequency shift of TiN resonators which is inconsistent with the predicted TLSmodel.

Improved superconducting qubit coherence using titanium nitride