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Shape anisotropy provides a simple mechanism to adjust the local bias fieldin patterned structures. It is well known that for ellipsoidal particles $<1$$\mu$m in size, a quasi-single domain state can be realized with uniformanisotropy field. For larger patterned ferromagnetic thin-film elements, domainformation is thought to limit the effectiveness of shape anisotropy. In ourwork we show that very soft lithographically patterned Ni$_{80}$Fe$_{20}$ filmswith control of induced magnetic anisotropy can exhibit shape anisotropy fieldsin agreement with single-domain models, for both hysteresis loop measurementsat low field and ferromagnetic resonance measurements at high field. We showthe superiority of the fluxmetric form over the magnetometric form ofanisotropy estimate for thin films with control dimensions from 10 $\mu$m to150 $\mu$m and in-plane aspect ratios above 10.

Single-domain shape anisotropy in near-macroscopic Ni$_{80}$Fe$_{20}$ thin-film rectangles