English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Tools annual

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Presents the access of premium content as premium feature

Premium Content

Global: Zendy Plus annual

Global: Zendy Free Plan

Scanning Thermal Microscopy (SThM) uses micromachined thermal sensorsintegrated in a force sensing cantilever with a nanoscale tip can be highlyuseful for exploration of thermal management of nanoscale semiconductordevices. As well as mapping of surface properties of related materials. WhereasSThM is capable to image externally generated heat with nanoscale resolution,its ability to map and measure thermal conductivity of materials has beenmainly limited to polymers or similar materials possessing low thermalconductivity in the range from 0.1 to 1 W/mK, with lateral resolution on theorder of 1 \mum. In this paper we use linked experimental and theoreticalapproaches to analyse thermal performance and sensitivity of the micromachinedSThM probes in order to expand their applicability to a broader range ofnanostructures from polymers to semiconductors and metals. We develop physicalmodels of interlinked thermal and electrical phenomena in these probes and thenvalidate these models using experimental measurements of the real probes, whichprovided the basis for analysing SThM performance in exploration ofnanostructures. Our study then highlights critical features of these probes,namely, the geometrical location of the thermal sensor with respect to theprobe apex, thermal conductance of the probe to the support base, heatconduction to the surrounding gas, and the thermal conductivity of tip materialadjacent to the apex. It is furthermore allows us to propose a novel design ofthe SThM probe that incorporates a carbon nanotube (CNT) or similar highthermal conductivity graphene sheet material positioned near the probe apex.The new sensor is predicted to provide spatial resolution to the thermalproperties of nanostructures on the order of few tens of nm, as well as toexpand the sensitivity of the SThM probe to materials with heat conductivityvalues up to 100-1000 W/mK.

Nanoscale spatial resolution probes for Scanning Thermal Microscopy of solid state materials