English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

Domain structures of epitaxial PbTiO3 films grown on (100)cSrRuO3//(100)SrTiO3 substrates by metalorganic chemical vapor deposition were investigated by x-ray diffraction (XRD) and piezoresponse force microscopy (PFM) techniques. It was found that with increasing film thickness, the domain structure changed from simple (001) polarization orientation to a complicated mixture of (001) and (100) orientations. PFM mappings showed that in the thicker films (∼1100 nm), the zigzag (001)/(100) domain boundaries made an angle of approximately 87° instead of 90° typically observed in (001)/(100) domain patterns in thinner (<300 nm) films. Full-relaxed tilting angle θ1 + θ2 + θ3 = 3.4° obtained from cross-sectional profile analysis of topological step-terrace structure was in good agreement with 3.4° and 3.6° angle values obtained from XRD measurements and theoretical prediction, respectively.

Complex domain structure in relaxed PbTiO3 thick films grown on (100)cSrRuO3//(100)SrTiO3 substrates