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Porous silicon layers were embedded with ZnTe using the isothermal closespace sublimation technique. The presence of ZnTe was demonstrated usingcross-sectional energy dispersive spectroscopy maps. ZnTe embedded samplespresent intense room temperature photoluminescence along the whole visiblerange. We ascribe this PL to ZnTe nanocrystals of different sizes grown on theinternal pore surface. Such crystals, with different orientations and sizes,were observed in transmission electron microscopy images, while transmissionelectron diffraction images of the same regions reveal ZnTe characteristicpatterns.

Intense white luminescence in ZnTe embedded porous silicon