English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

The lateral distributions of intrinsic point defects in n-type (0001) 4H-SiC have been investigated following room temperature irradiation with a focused beam of 10 keV protons. Laterally resolved deep level transient spectroscopy measurements reveal that the well-known and prominent Z1/2 and S1/2 centers display lateral diffusion lenghts on the order of 1 mm with negligible (if any) motion parallel to the direction of the c-axis. The migration occurs only in the presence of excess charge carriers generated during the proton irradiation, and no further motion takes place even under subsequent optical excitation of high intensity. Assuming one-dimensional geometry, an effective defect diffusivity in excess of 10−6 cm2/s is deduced by numerical modelling of the experimental data, corresponding to an energy barrier for migration of ∼0.2 eV. Possible mechanisms for the rapid migration, invoking charge carrier recombination as a necessary condition, are discussed, and especially, an association with the glide of partial dislocations along the (0001) basal plane is scrutinized in some detail.This research was originally published in the Journal of Applied Physics. © AIP Publishin

Long range lateral migration of intrinsic point defects in n-type 4H-SiC