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NiO6-octahedral tilts in ultrathin LaNiO3 films were studied using positionaveraged convergent beam electron diffraction (PACBED) in scanning transmissionelectron microscopy. Both the type and magnitude of the octahedral tilts weredetermined by comparing PACBED experiments to frozen phonon multislicesimulations. It is shown that the out-of-plane octahedral tilt of an epitaxialfilm under biaxial tensile stress (0.78 % in-plane tensile strain) increases by~ 20%, while the in-plane rotation decreases by ~ 80%, compared to theunstrained bulk material.

Nanoscale Quantification of Octahedral Tilts in Perovskite Films