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We used the technique of vector generalized magneto-optical ellipsometry to study the behavior of the magnetization vector of a 50 nm Co thin film as a function of external field magnitude and direction. We determined the relative contributions of magnetization rotation and domain formation to the reversal of M. The Co sample had a uniaxial in-plane anisotropy. When the angle between the applied field and the easy axis was greater than ∼40°, the reversal occurred primarily by rotation of the magnetization, accompanied by a small reduction of the magnitude of M. In this angular region, the field at which there is a large jump in the angle of M as a function of applied field angle followed a single domain coherent rotation model. However, at applied field angles less than 40° to the easy axis, a larger reduction in |M| occurred during the jump in the magnetization angle. The jump also occurred at fields much lower than those predicted by the coherent rotation model, indicating a reversal mode initiated by d...

Studying the reversal mode of the magnetization vector versus applied field angle using generalized magneto-optical ellipsometry