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of detection that is used and is most prominent with optical lever detection. Another aspect is the influence of the scanning configuration or system itself. The latter concerns cantilever geometry, cantilever mechanical properties, sample orientation, and detector orientation. As far as the detection side is concerned, especially the optical lever system can be shown to be more sensitive to a lateral movement of the probe than a vertical deflection. 5 Keeping this in mind, the interpretation of the detected signal can be rather misleading. The forces in the perpendicular direction are often associated with the long-axis signal component of the cantilever, while the short-axis component is taken for the friction signal. 6,7 At an atomic scale, one should be cautious in making this assumption: along both axes the scan signal can be shown to follow friction-based behavior, as will be explained later. Even when the origin of the cantilever movement is unambiguously frictional, it is still not straightforward to interpret the signal in terms of the interaction force between probe tip and substrate. In various publications, attention was focused on the strong stick-slip nature of the signal. 4,8‐15 Here, the movement of the tip relative to the scan path resembles a relaxation oscillation, 16 i.e., static ~stick! phases alternate fast-moving slip-phases. The driving frequency in this picture is the periodicity of the lattice in combination with the scanning speed. Recently, the concept of atomicperiodicity stick slip is made more explicit in a twodimensional description. 15,17,18 The tip follows the forced scan path of the cantilever base by a series of discrete jumps from lattice point to lattice point. The difference between the continuous cantilever base route and the zig-zag motion of the tip, thus is the predominant cause for the well known images showing atomic resolution, especially of layered compounds ~Fig. 1!. In literature, this is clarified in various ways that, however, mainly differ in actual representations: l The perpendicular components of the tip displacement are usually associated with the ‘‘force’’ and ‘‘friction’’ signal. These signals were used to restore the original route of the tip. 18

Influence of spring stiffness and anisotropy on stick-slip atomic force microscopy imaging