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We use infrared thermometry of carbon nanotube network (CNN) transistors andfind the formation of distinct hot spots during operation. However, the averageCNN temperature at breakdown is significantly lower than expected from thebreakdown of individual nanotubes, suggesting extremely high regions of powerdissipation at the nanotube junctions. Statistical analysis and comparison witha thermal model allow the extraction of the average tube-tube junction thermalresistance, ~4.4x10^11 K/W (thermal conductance ~2.27 pW/K). This indicatesthat nanotube junctions have a much greater impact on CNN transport,dissipation, and reliability than extrinsic factors such as low substratethermal conductivity.

Imaging Dissipation and Hot Spots in Carbon Nanotube Network Transistors