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We report on the coherent reflection spectroscopy of a high-quality factormicropillar, in the strong coupling regime with a single InGaAs annealedquantum dot. The absolute reflectivity measurement is used to study thecharacteristics of our device at low and high excitation power. The strongcoupling is obtained with a g=16 \mueV coupling strength in a 7.3\mum diametermicropillar, with a cavity spectral width kappa=20.5 \mueV (Q=65 000). Thefactor of merit of the strong-coupling regime, 4g/kappa=3, is the currentstate-of-the-art for a quantum dot-micropillar system.

Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar