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We report a Raman scattering investigation of KTa1-xNbxO3 (x = 0.35, 0.5)thin films deposited on MgO and LaAlO3 as a function of temperature. Theobserved phase sequence in the range from 90 K to 720 K is similar to thestructural phase transitions of the end-member material KNbO3. Although similarin the phase sequence, the actual temperatures observed for phase transitiontemperatures are significantly different from those observed in the literaturefor bulk samples. Namely, the tetragonal (ferroelectric) to cubic(paraelectric) phase transition is up to 50 K higher in the films when comparedto bulk samples. This enhanced ferroelectricity is attributed to biaxial strainin the investigated thin films.

Temperature-dependent Raman scattering of KTa1-xNbxO3 thin films