English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We report results of micro-Raman spectroscopy investigation of the"graphene-like" mechanically exfoliated single-crystal bismuth telluride filmswith the thickness ranging from a few-nm-range to bulk limit. It is found thatthe optical phonon mode A1u, which is not-Raman active in bulk bismuthtelluride crystals, appears in the atomically-thin films due tocrystal-symmetry breaking. The intensity ratios of the out-of-plane A1u and A1gmodes to the in-plane Eg mode grow with decreasing film thickness. Theevolution of Raman signatures with the film thickness can be used foridentification of bismuth telluride crystals with the thickness offew-quintuple layers, which are important for topological insulator andthermoelectric applications.

Crystal Symmetry Breaking in Few-Quintuple Bismuth Telluride Films: Applications in Nanometrology of Topological Insulators