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Epitaxial bilayered thin films consisting of La0.6Sr0.4MnO3 (LSMO) and 0.7Pb(Mg1/3Nb2/3)O3 0.3 PbTiO3 (PMN-PT) layers of relatively different thicknesseswere fabricated on LaNiO3 coated LaAlO3 (100) single crystal substrates bypulsed laser ablation technique. Ferroelectric and ferromagneticcharacteristics of these heterostructures confirmed their biferroic nature. Themagnetization and ferroelectric polarization of the bilayered heterostructureswere enhanced with increasing PMN-PT layer thickness owing to the effect oflattice strain. Dielectric properties of these heterostructures studied over awide range of temperature under different magnetic field strength suggested apossible role of elastic strain mediated magnetoelectric coupling behind theobserved magneto-dielectric effect in addition to the influence ofrearrangement of the interfacial charge carriers under an applied magneticfield.

Investigation of biferroic properties in La0.6Sr0.4MnO3/0.7 Pb(Mg1/3Nb2/3)O3 0.3 PbTiO3 epitaxial bilayered heterostructures