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Reversible and irreversible discontinuities at around 573 K and 823 K in theelectric conductivity of a strained 175 nm thin film of(La0.8Sr0.2)0.95Ni0.2Fe0.8O3-{\delta} grown by pulsed laser deposition onSrTiO3 (110) are reflected by valence band changes as monitored inphotoemission and oxygen K-edge x-ray absorption spectra. The irreversible jumpat 823 K is attributed to depletion of doped electron holes and reduction ofFe4+ to Fe3+, as evidenced by oxygen and iron core level soft x-rayspectroscopy, and possibly of a chemical origin, whereas the reversible jump at573 K possibly originates from structural changes.

applied physics letters

Correlation of high temperature X-ray photoemission spectral features  and conductivity of epitaxially strained  (La0.8Sr0.2)0.95Ni0.2Fe0.8O3/SrTiO3(110)