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We report on near normal infrared reflectivity spectra of ~550 nm thick filmsmade of cosputtered transition metal nanograins and SiO2 in a wide range ofmetal fractions. Co0.85(SiO2)0.15,with conductivity well above the percolationthreshold has a frequency and temperature behavior according to what it is findin conducting metal oxides. The electron scattering rate displays an uniquerelaxation time characteristic of single type of carriers experiencing strongelectron-phonon interactions. Using small polaron fits we identify thosephonons as glass vibrational modes. Ni0.61(SiO2)0.39, with a metal fractioncloser to the percolation threshold, undergoes a metal-non metal transition at~77 K. Here, as it is suggested by the scattering rate nearly quadraticdependence, we broadly identify two relaxation times (two carriercontributions) associated to a Drude mode and a mid-infrared overdamped band,respectively. Disorder induced, the mid-infrared contribution drives the phasetransition by thermal electron localization. Co0.51(SiO2)0.49 has thereflectivity of an insulator with a distinctive band at ~1450cm\^{-1}originating in electron promotion, localization, and defect induced polaronformation. Angle dependent oblique reflectivity of globally insulatingCo0.38(SiO2)0.62, Fe0.34(SiO2)0.66, and Ni0.28(SiO2)0.72, reveals a remarkableresonance at that band threshold. We understand this as due to the excitationby normal to the film electric fields of defect localized electrons in themetallic nanoparticles

Electron Dynamics in Films Made of Transition Metal Nanograins Embedded in SiO2:Infrared Reflectivity and Nanoplasma Infrared Resonance