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We developed a model with no adjustable parameter for retention loss at shortand long time scale in ferroelectric thin-film capacitors. We found that thepredictions of this model are in good agreement with the experimentalobservations in the literature. In particular, it explains why a power-lawfunction shows better fitting than a linear-log relation on a short time scale(10^-7 s to 1 s) and why a stretched exponential relation gives more precisedescription than a linear-log plot on a long time scale (>100 s), as reportedby many researchers in the past. More severe retention losses at highertemperatures and in thinner films have also been correctly predicted by thepresent theory.

A model for retention on short, intermediate and long time-scale in ferroelectric thin films