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High spatial resolution X-ray photo-emission electron microscopy techniquehas been used to study the influence of the dipolar coupling taking placebetween the NiFe and the Co ferromagnetic electrodes of micron sized,elliptical shaped magnetic tunnel junctions. The chemical selectivity of thistechnique allows to observe independently the magnetic domain structure in eachferromagnetic electrode. The combination of this powerful imaging techniquewith micromagnetic simulations allows to evidence that a 360 degree domain wallcan be stabilized in the NiFe soft layer. In this letter, we discuss the originand the formation conditions of those 360 degree domain walls evidencedexperimentally and numerically.

360 degree domain wall generation in the soft layer of magnetic tunnel junctions