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The effects of growth rate (G_r), deposition temperature (T_d), filmthickness (t_F), and substrate induced strain (epsilon) on morphological,crystallographic and magnetic characteristics of equiatomic CoPt epitaxialfilms synthesized with PLD are investigated. The (001) substrates of MgO, STOand LAO provide different degree of epitaxial strain for growth of thedisordered face centered cubic (fcc) and ordered face centered tetragonal(L1_0) phases of CoPt. The films deposited at T_d~600 ^0C on all threesubstrates are fcc with in-plane magnetization and a narrow hysteresis loop ofwidth~200 Oe. The L1_0 phase, stabilized only at T_d~700 ^0C becomespredominantly c-axis oriented as T_d is increased to 800 ^0C. While thecrystallographic structure of the films depends solely on the T_d, theirmicrostructure and magnetization characteristics are decided by the growthrate. At the higher G_r (~1A/sec) the L1_0 films have a maze-like structurewhich converts to a continuous film as the t_F is increased from 20 to 50 nm.The H_c of these films increases as the L1_0 phase fraction grows with T_d andits orientation becomes out of the film plane. The evolution of microstructurewith T_d is remarkably different at lower growth rate (~0.4A /sec). Here thestructure changes from a self-similar fractal pattern to an assembly ofnano-dots as the T_d is raised from 700 to 800 ^0C, and is understood in termsof the imbalance between strain and interfacial energies. MFM of such filmsreveals no distinct domain walls within the nano-islands while a clear contrastis seen between the islands of reversed magnetization. The simple picture ofcoherent rotation of moment appears incompatible with the time dependence ofthe remanent magnetization in these films.

Correlations between morphology, crystal structure and magnetization of epitaxial cobalt-platinum films grown with pulsed laser ablation