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At first sight piezoresponse force microscopy (PFM) seems an ideal techniquefor the determination of piezoelectric coefficients (PCs), thus making use ofits ultra-high vertical resolution (<0.1 pm/V). Christman et al. \cite{Chr98}first used PFM for this purpose. Their measurements, however, yielded onlyreasonable results of unsatisfactory accuracy, amongst others caused by anincorrect calibration of the setup. In this contribution a reliable calibrationprocedure is given followed by a careful analysis of the encounted difficultiesdetermining PCs with PFM. We point out different approaches for their solutionand expose why, without an extensive effort, those difficulties can not becircumvented

Challenges for the determination of piezoelectric constants with piezoresponse force microscopy