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A simple, reliable method for preparation of bulk Cr tips for ScanningTunneling Microscopy (STM) is proposed and its potentialities in performinghigh-quality and high-resolution STM and Spin Polarized-STM (SP-STM) areinvestigated. Cr tips show atomic resolution on ordered surfaces. Contrary towhat happens with conventional W tips, rest atoms of the Si(111)-7x7reconstruction can be routinely observed, probably due to a differentelectronic structure of the tip apex. SP-STM measurements of the Cr(001)surface showing magnetic contrast are reported. Our results reveal that thepeculiar properties of these tips can be suited in a number of STM experimentalsituations.

Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy