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In this paper, we report on the photoelectronic properties of TPD studied insandwich geometry. In particular, we have obtained from both forward andreverse bias measurements the "mew-tau" product for holes in TPD. "mew" is thehole mobility and "tau" the carrier trapping time. The "mew-tau" product is ameasure of the electronic quality of the material and allows a quantitativecomparison of different samples. We have carried out numerical simulations tounderstand the photocurrent in these structures. We show that in reverse bias,the photocurrent (PC) is due to bulk. The carrier generation is governed byfield assisted exciton dissociation at electric fields greater than 10^6 V/cm.At lower fields the generation of carriers occurs spontaneously in the bulk ofthe sample. In forward bias, the photocurrent is due to exciton dissociation atthe ITO contact. We also obtain a "mew-tau" product for holes from forward biasPC measurements which is in agreement with the value obtained from reverse biasmeasurements. Based on our experiments, we demonstrate that TPD in a sandwichstructure is a good candidate for cheap large area solar blind UV detectorarrays.Comment: Submitted to J. Appl. Phy

Bulk and contact-sensitized photocarrier generation in single layer organic devices