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We propose and demonstrate a spatial partition method for the high-frequencyphoto-response of superconducting devices correlated with inductive andresistive changes in microwave impedance. Using a laser scanning microscope, weshow that resistive losses are mainly produced by local defects at microstripedges and by intergrain weak links in the high-temperature superconductingmaterial. These defects initiate nonlinear high-frequency response due toovercritical current densities and entry of vortices.Comment: 4 pages, 4 figures, submitted to Applied Physics Letter

Measurement of local reactive and resistive photoresponse of a superconducting microwave device