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Optical characterization of AlGaAs microdisk resonant cavities with a quantumdot active region is presented. Direct passive measurement of the optical losswithin AlGaAs microdisk resonant structures embedded with InAs/InGaAsdots-in-a-well (DWELL) is performed using an optical-fiber-based probingtechnique at a wavelength (lambda~1400 nm) that is red-detuned from the dotemission wavelength (lambda~1200 nm). Measurements in the 1400 nm wavelengthband on microdisks of diameter D = 4.5 microns show that these structuressupport modes with cold-cavity quality factors as high as 360,000.DWELL-containing microdisks are then studied through optical pumping at roomtemperature. Pulsed lasing at lambda ~ 1200 nm is seen for cavities containinga single layer of InAs dots, with threshold values of ~ 17 microWatts,approaching the estimated material transparency level. Room-temperaturecontinuous wave operation is also observed.Comment: 4 pages, 3 figure

Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots