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We present a comparative study of the angular dependent critical currentdensity in YBa2Cu3O7 films deposited on IBAD MgO and on single crystal MgO andSrTiO3 substrates. We identify three angular regimes where pinning is dominatedby different types of correlated and uncorrelated defects. We show that thoseregimes are present in all cases, indicating that the pinning mechanisms arethe same, but their extension and characteristics are sample dependent,reflecting the quantitative differences in texture and defect density. Inparticular, the more defective nature of the films on IBAD turns into anadvantage as it results in stronger vortex pinning, demonstrating that thecritical current density of the films on single crystals is not an upper limitfor the performance of the IBAD coated conductors.Comment: 14 pages, 3 figures. Submitted to AP

Angular-dependent vortex pinning mechanisms in YBa2Cu3O7 coated conductors and thin films