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FeTaN/TaN/FeTaN sandwich films, FeTaN/TaN and TaN/FeTaN bilayers weresynthesized by using RF magnetron sputtering. The magnetic properties,crystalline structures, microstructures and surface morphologies of theas-deposited samples were characterized using angle-resolved M-H loop tracer,VSM, XRD, TEM, AES and AFM. An evolution of the in-plane anisotropy wasobserved with the changing thickness of the nonmagnetic TaN interlayer in theFeTaN/TaN/FeTaN sandwiches, such as the easy-hard axis switching and theappearing of biaxial anisotropy. It is ascribed to three possible mechanisms,which are interlayer magnetic coupling, stress, and interface roughness,respectively. Interlayer coupling and stress anisotropies may be the majorreasons to cause the easy-hard axis switching in the sandwiches. Whereas,magnetostatic and interface anisotropies may be the major reasons to causebiaxial anisotropy in the sandwiches, in which magnetostatic anisotropy is thedominant one.Comment: 6 pages, 3 figure

Evolution of in-plane magnetic anisotropy in sputtered FeTaN/TaN/FeTaN sandwich films