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Scanning Surface Potential Microscopy (SSPM) is one of the most widely usedtechniques for the characterization of electrical properties at smalldimensions. Applicability of SSPM and related electrostatic scanning probemicroscopies for imaging of potential distributions in active micro- andnanoelectronic devices requires quantitative knowledge of tip surface contrasttransfer. Here we demonstrate the utility of carbon-nanotube-based circuits tocharacterize geometric properties of the tip in the electrostatic scanningprobe microscopies (SPM). Based on experimental observations, an analyticalform for the differential tip-surface capacitance is obtained.Comment: 14 pages, 4 figure

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies