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5« 0Ks /(s2s*). Theoretical predictions are compared with the measured stress dependence of the dielectric response of polycrystalline Ba 0.7Sr0.3TiO3 films grown on Pt/SiO 2 /Si. The theory explains the observed dielectric behavior and predicts the existence of in-plane polarization state in this film/substrate system. © 2000 American Institute of Physics.@S0003-6951~00!03542-7#

Curie–Weiss-type law for the strain and stress effects on the dielectric response of ferroelectric thin films