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We describe near-field imaging of sample sheet resistance via frequencyshifts in a resonant coaxial scanning microwave microscope. The frequencyshifts are related to local sample properties, such as surface resistance anddielectric constant. We use a feedback circuit to track a given resonantfrequency, allowing measurements with a sensitivity to frequency shifts assmall as one parts in 50000 for a 30 ms sampling time. The frequency shifts canbe converted to sheet resistance based on a simple model of the system.Comment: 6 pages, 3 figures; for color versions of figures see  www.csr.umd.edu/research/hifreq/micr_microscopy.htm

Surface resistance imaging with a scanning near-field microwave microscope