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We present Schlieren images which show the existence and evolution of current filaments during the very early stages of surface‐related breakdown inside 1 cm silicon p+‐n−‐n+ structures. These images confirm our previous finding that breakdown occurs in the silicon rather than in the ambient, and suggest that a streamerlike mechanism may be responsible.

Surface-related breakdown in silicon: Imaging of current filaments in long p+-n−-n+ structures