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The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 nm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found.

Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces