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Ion mobility spectrometers (IMS) are versatile gas analyzers. Due to their small size and robustness, combined with a very high sensitivity, they are often used in gas sensing applications such as environmental monitoring. In order to improve the selectivity, they are typically combined with a mass spectrometer (MS). Since IMS works at atmospheric pressure, and MS works at vacuum, a special interface reducing the pressure over normally two stages has to be used. In this paper the influence of this coupling of different pressure areas on the IMS signal will be analyzed with help of finite elements method simulations

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Influence of the coupling between an atmospheric pressure ion mobility spectrometer and the low pressure ion inlet of a mass spectrometer on the mobility measurement