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X-ray diffraction measurements of Nb3Sn mono- and rnultifilamentary tapes have been performed in the temperature range 5 ≤ T ≤ 300 K under variable axial stress by means of a newly constructed device. The changes of the stress-induced crystallographical modification of the A15 phase have been observed as a function of applied strain ε

DIRECT OBSERVATION OF CRYSTALLOGRAPHICAL CHANGES AT 10 K CAUSED BY THE APPLICATION OF VARYING STRESSES TO Nb3Sn WIRES

DIRECT OBSERVATION OF CRYSTALLOGRAPHICAL CHANGES AT 10 K CAUSED BY THE APPLICATION OF VARYING STRESSES TO Nb₃Sn WIRES