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Comparative HV-microhardness and TEM studies of Ti-50.0at%Ni and 50.26at%Ni alloys subjected to cold-rolling (e=0.3, 1 and 1.72) and post-deformation annealing at 100-700°C (1 hour) are presented. Based on the TEM-measured grain size data for Ti-50.0at%Ni alloy as a function of an annealing temperature (TPDA) higher than 250 o C, it was possible to evaluate the grain size (d) of the near-equiatomic Ti-Ni alloys at TPDA<250 o C, using exponential extrapolation distribution of the d-TPDA data. It was shown that below a critical grain size (dc = 10 nm), the smaller the grain size (as a result of the decrease in annealing temperature), the lower the microhardness. This softening phenomena can be described, with good correlation between the approximation and experimental data, by the normal-abnormal Hall-Petch transition caused by the influence of the intercrystalline regions and by the melting temperature grain-size dependence.

Microhardness of binary near-equiatomic Ti-Ni alloys after severe cold rolling and post-deformation annealing