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Polysilicon-on-oxide (POLO) passivating contacts and interdigitated back-contact (IBC) cell technologies have recently attracted a lot of interest as candidates for the implementation in the next generation of solar cells. An IBC cell with POLO junctions for both polarities − a POLO 2 -IBC cell − has to electrically isolate the highly defective  p  +  and  n  +  poly-Si regions on the rear side of the cell to avoid parasitic recombination. Inserting an initially undoped, intrinsic ( i ) region between the  p  +  and  n  +  poly-Si regions was demonstrated to successfully prevent the parasitic recombination in the transition region of ISFH's 26.1%-efficient POLO 2 -IBC cell. In order to further improve the conversion efficiency towards 27%, we apply hydrogen-donating dielectric layer stacks to the  p  + -( i) - n  +  POLO interdigitating rear side to enhance the passivation quality of the POLO junctions. We indeed show a significant improvement of POLO junctions on symmetrical full-area homogenously doped reference samples, but when we apply a hydrogen-donating layer stack on the  p  + -( i) - n  +  POLO interdigitating rear side, we observe a strong degradation in the performance of the POLO 2 -IBC cell. We attribute this to the formation of a conductive channel between the  p  +  and  n  +  poly-Si regions due to the strong negative charge density of the hydrogen-donating layer stack.

epj photovoltaics

Rear side dielectrics on interdigitating p+-(i)-n+ back-contact solar cells − hydrogenation vs. charge effects