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We present a new behavioural model that combines high frequency and low frequency subcircuits to predict the effect of radio frequency interference (RFI) on linear integrated circuits. The model is constructed from measured and manufacturers data, and can determine the failure mechanisms in analogue systems subjected to RFI. The results of measurements and simulations of circuits containing one and two op-amps demonstrate the principle of the model.

Two level, in-band/out-of-band modelling RF interference effects in integrated circuits and electronic systems