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Polymer nanocomposite materials based on metallic nanowires are widelyinvestigated as transparent and flexible electrodes or as stretchableconductors and dielectrics for biosensing. Here we show that ScanningDielectric Microscopy (SDM) can map the depth distribution of metallicnanowires within the nanocomposites in a non-destructive way. This is achievedby a quantitative analysis of sub-surface electrostatic force microscopymeasurements with finite-element numerical calculations. As an application wedetermined the three-dimensional spatial distribution of around 50 nm diametersilver nanowires in 100 - 250 nm thick gelatin films. The characterization isdone both under dry ambient conditions, where gelatin shows a relatively lowdielectric constant, epsilon around 5, and under humid ambient conditions,where its dielectric constant increases up to epsilon around 14. The presentresults show that SDM can be a valuable non-destructive subsurfacecharacterization technique for nanowire-based nanocomposite materials, whichcan contribute to the optimization of these materials for applications infields such as wearable electronics, solar cell technologies or printableelectronics.

Depth mapping of metallic nanowire polymer nanocomposites by scanning dielectric microscopy