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The analysis of the electronic surface properties of transition metal oxidesbeing key materials for future nanoelectronics requires a directcharacterization of the conductivity with highest spatial resolution. Usinglocal conductivity atomic force microscopy (LC-AFM) we demonstrate thepossibility of recording current maps with true atomic resolution. Theapplication of this technique on surfaces of reduced TiO$_2$ and SrTiO$_3$reveals that the distribution of surface conductivity has a significantlocalized nature. Assisted by density functional theory (DFT) we propose thatthe presence of oxygen vacancies in the surface layer of such materials canintroduce short range disturbances of electronic structure with confinement ofmetallic states on the nanoscale.

Detection of confined current paths on oxide surfaces by local-conductivity atomic force microscopy with atomic resolution