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We present a method to carry out electrical and opto-electronic measurementson 2D materials using carbon fiber microprobes to directly make electricalcontacts to the 2D materials without damaging them. The working principle ofthis microprobing method is illustrated by measuring transport in MoS2 flakesin vertical (transport in the out-of-plane direction) and lateral (transportwithin the crystal plane) configurations, finding performances comparable tothose reported for MoS2 devices fabricated by conventional lithographicprocess. We also show that this method can be used with other 2D materials.

Lithography-free electrical transport measurements on 2D materials by direct microprobing