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Graphene grown by chemical vapour deposition is transferred on top of flatgold nanoislands and characterized by scanning tunnelling microscopy (STM) andatomic force microscopy (AFM). Graphene bubbles are formed with lateraldimensions determined by the size and shape of nanoislands. These graphenebubbles can be squeezed during STM imaging using bias voltages of less than 250mV and tunnelling currents of 1 nA. Similarly, the graphene suspended over goldnanovoids is deflected 4 - 5 nm by the STM tip when imaging at low biasvoltages (U = 30 mV). Nanoindentation measurements performed by AFM show thatthe squeezing of graphene bubbles occurs at repulsive forces of 20 - 35 nN, andsuch forces can result in deflections of several nanometres in suspendedgraphene parts, respectively. Comparing the AFM and STM results, this studyreveals that mechanical forces of the order of 10e-8 N occur between the STMtip and graphene under ambient imaging conditions and typical tunnellingparameters.

Determination of the STM tip-graphene repulsive forces by comparative STM and AFM measurements on suspended graphene