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We present a novel approach for the simultaneous determination of the thermal conductivity  κ  and the total interface conductance  g  of supported 2D materials by the enhanced opto-thermal method. We harness the property of the Gaussian laser beam that acts as a heat source, whose size can easily and precisely be controlled. The experimental data for multi-layer graphene and MoS 2  flakes are supplemented using numerical simulations of the heat distribution in the Si/SiO2/2D material system. The procedure of  κ  and  g  extraction is tested in a statistical approach, demonstrating the high accuracy and repeatability of our method.

High accuracy determination of the thermal properties of supported 2D materials