English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

A new approach for achieving two  –  dimensional  ( 2D )  atom localization microscopy based on the projection of three  –  dimensional  ( 3D )  localization in the plane of the detector  is described in the present work. Spatial variation of the position-dependent 2D-localization pattern in the  x  y -plane is obtained with the shifting of the position of the detector along the z-axis under the parallel- and cross- axis configurations of the standing-wave fields. An attempt is made to study the 2D-localization characteristics in the specific parametric conditions for which the localization structures evolve with different shapes eventually leading to 100% detection probability of the atom both in the sub-wavelength and sub-half-wavelength regimes. The scope of tuning the cross-axis configuration over a wide range adds novelty and robustness to this model. Apart from the 2D-localization, various localization patterns with eight- to single-peak structures appear as interesting outcomes through the efficient manipulation of control parameters in the study of one-dimensional (1D) atom localization. The application of the traveling-wave field or its equivalent appears to be unique in achieving high-precision localization with maximal probability (100%) in both the 1D and 2D field-configuration schemes. Proper tuning of the traveling wave accompanied by the standing wave in the 1D scheme results in the single-peak localization in the sub-half-wavelength range. As a whole, the present work seems to be very much efficient for high-precision optical lithography.

scientific reports

Optical absorption microscopy of localized atoms at microwave domain: two-dimensional localization based on the projection of three-dimensional localization