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For realization the new functional materials and devices by conductivenanomaterials, how to control and realize the optimum networks structures areimport point for fundamental, applied and industrial science. In thismanuscript, the nondestructive real-space imaging technique has been studiedwith the lock-in thermal scope via Joule heating caused by ac bias conditions.By this dynamical method, a few micrometer scale current distributions arevisualized in a few tens of minutes due to the frequency-space separation andthe strong temperature damping of conductive heat components. Moreover, in thetensile test, the sample broken points were completely corresponding to theintensity images of lock-in thermography. These results indicated that thelock-in thermography is a powerful tool for inspecting the intrinsic networkstructures, which are difficult to observe by conventional imaging methods.

Nondestructive real-space imaging of current density distributions in randomly networked conductive nanomaterials