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X-ray emission spectroscopy is a well-established technique used to studycontinuum lowering in dense plasmas. It relies on accurate atomic physicsmodels to robustly reproduce high-resolution emission spectra, and depends onour ability to identify spectroscopic signatures such as emission lines orionization edges of individual charge states within the plasma. Here wedescribe a method that forgoes these requirements, enabling the validation ofdifferent continuum lowering models based solely on the total intensity ofplasma emission in systems driven by narrow-bandwidth x-ray pulses across arange of wavelengths. The method is tested on published Al spectroscopy dataand applied to the new case of solid-density partially-ionized Fe plasmas,where extracting ionization edges directly is precluded by the significantoverlap of emission from a wide range of charge states.

Validating Continuum Lowering Models via Multi-Wavelength Measurements of Integrated X-ray Emission