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Atomically resolved images of monolayer organic crystals have only beenobtained with scanning probe methods so far. On the one hand, they are usuallyprepared on surfaces of bulk materials, which are not accessible by (scanning)transmission electron microscopy. On the other hand, the critical electron doseof a monolayer organic crystal is orders of magnitudes lower than the one forbulk crystals, making (scanning) transmission electron microscopycharacterization very challenging. In this work we present an atomicallyresolved study on the dynamics of a monolayer CuPcCl\textsubscript{16} crystalunder the electron beam as well as an image of the undamaged molecules obtainedby low-dose electron microscopy. The results show the dynamics and theradiation damage mechanisms in the 2D layer of this material, complementingwhat has been found for bulk crystals in earlier studies. Furthermore, beingable to image the undamaged molecular crystal allows the characterization ofnew composites consisting of 2D materials and organic molecules.

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Insights into radiation damage from atomic resolution scanning  transmission electron microscopy imaging of mono-layer CuPcCl$_{16}$ films on  graphene